Dielectric properties of capacitor materials in the optical frequency range

IEEE International Symposium on Applications of Ferroelectrics

Volumn , Issue , 2002, Pages 7-10

  Biegalski, Michael ^a   Thayer, Ryan ^a   Nino, Juan ^a   Trolier McKinstry, Susan ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; ELLIPSOMETRY; INFRARED RADIATION; SEMICONDUCTOR MATERIALS; ULTRAVIOLET RADIATION;

OPTICAL FREQUENCY RANGE;

CAPACITORS;

EID: 0038680585     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)

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