Examination of sol-gel production repeatability by statistical pattern recognition methods

Optical Engineering

Volumn 42, Issue 4, 2003, Pages 1137-1143

  Kobel, Joanna ^a   Suchwałko, Artur ^a   Podbielska, Halina ^a   Ulatowska Jarza, Agnieszka ^a  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Cluster analysis; Dimensionality reduction; Pattern recognition; Repeatability of production; Sol gel matrix

Indexed keywords

DATA REDUCTION; IMAGE ANALYSIS; MICROSCOPIC EXAMINATION; PATTERN RECOGNITION; SOLVENTS; SUBSTRATES;

SOL-GEL MATRIX;

SOL-GELS;

EID: 0038679473     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1555996     Document Type: Article

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