Glide and climb of dislocations in ultra-thin metal films

Materials Science Forum

Volumn 426-432, Issue 4, 2003, Pages 3421-3426

  De la Figuera, J ^a   Schmid, A K ^b   Pohl, K ^c   Bartelt, N C ^e   Carter, C B ^d   Hwang, R Q ^e  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c University of New Hampshire   (United States)

^d UNIVERSITY OF MINNESOTA   (United States)

^e SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Misfit dislocations; Scanning tunneling microscopy; Surface defects; Surface diffusion

Indexed keywords

ATOMS; DIFFUSION; DISLOCATIONS (CRYSTALS); MONOLAYERS; OPTICAL RESOLVING POWER; SCANNING TUNNELING MICROSCOPY; SURFACES;

SURFACE DIFFUSION;

ULTRATHIN FILMS;

EID: 0038676251     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.426-432.3421     Document Type: Conference Paper

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