Layer-thickness dependence of the conductive properties of Mo/Si multilayers

Physical Review B - Condensed Matter and Materials Physics

Volumn 58, Issue 13, 1998, Pages 8805-8811

  Elliott, Greg S ^a   Gromko, Adam D ^a   VandeVeegaete, Francis ^a   Johnson, Christopher D ^b   Johnson, David C ^b  

^a UNIVERSITY OF PUGET SOUND   (United States)

^b UNIVERSITY OF OREGON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038671953     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.8805     Document Type: Article

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