Reflectance anisotropy during growth of Pb nanowires on well ordered Si(3 3 5) surface

Applied Surface Science

Volumn 211, Issue 1-4, 2003, Pages 209-215

  Jalochowski M ^a   Strozak M ^a   Zdyb, R ^a  

^a MARIA CURIE SK ODOWSKA UNIVERSITY   (Poland)

Author keywords

Nanowires; Optical reflectance; Pb; RHEED; Si(3 3 5); STM; Vicinal surface

Indexed keywords

ANISOTROPY; DEPOSITION; DIELECTRIC PROPERTIES; FILM GROWTH; HIGH ENERGY ELECTRON DIFFRACTION; LEAD; PHOTONS; SCANNING TUNNELING MICROSCOPY; SILICON; SUBSTRATES; THERMAL EFFECTS; ULTRATHIN FILMS;

NANOWIRES;

NANOSTRUCTURED MATERIALS;

EID: 0038671738     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00228-9     Document Type: Article

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