Feature extraction based on the Bhattacharyya distance

Pattern Recognition

Volumn 36, Issue 8, 2003, Pages 1703-1709

  Choi, Euisun ^a   Lee, Chulhee ^a  

^a Yonsei University   (South Korea)

Author keywords

Bayes error estimation; Bhattacharyya distance; Classification error; Feature extraction; Optimization

Indexed keywords

ALGORITHMS; ERROR ANALYSIS; ITERATIVE METHODS;

ERROR ESTIMATION EQUATION;

FEATURE EXTRACTION;

IMAGE CLASSIFICATION; OPTIMIZATION; PATTERN RECOGNITION;

EID: 0038667918     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0031-3203(03)00035-9     Document Type: Article

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