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Volumn 82, Issue 19, 2003, Pages 3212-3214
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High-quality InAsyP1-y step-graded buffer by molecular-beam epitaxy
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL LATTICES;
DISLOCATIONS (CRYSTALS);
LATTICE CONSTANTS;
MOLECULAR BEAM EPITAXY;
MORPHOLOGY;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
STRESS RELAXATION;
SURFACE ROUGHNESS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
STEP-GRADED BUFFERS;
INDIUM ALLOYS;
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EID: 0038657691
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1572476 Document Type: Article |
Times cited : (35)
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References (14)
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