Magnetoresistance magnetometry of (Ni80Fe20)1-xlrx wires with varying anisotropic magnetoresistance ratio

Journal of Applied Physics

Volumn 93, Issue 10 3, 2003, Pages 8104-8106

  Vaz, C A F ^a   Blackburn, E ^a   Klaui M ^a   Bland, J A C ^a   Gan, Li ^b   Egelhoff Jr , W F ^b   Cambril, E ^c   Faini, G ^c   Wernsdorfer, W ^d  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c Lab Photon/Nanostruct   (France)

^d LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC ANISOTROPY; MAGNETIC FIELD EFFECTS; MAGNETIZATION; MAGNETORESISTANCE; NICKEL ALLOYS; SCANNING ELECTRON MICROSCOPY;

PERMALLOYS;

NANOSTRUCTURED MATERIALS;

EID: 0038656373     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1540056     Document Type: Conference Paper

References (6)

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