Random telegraph noise in a nickel nanoconstriction

Journal of Applied Physics

Volumn 93, Issue 10 3, 2003, Pages 8433-8435

  Cespedes O ^a   Jan, G ^a   Viret, M ^b   Bari, M ^a   Coey, J M D ^a  

^a TRINITY COLLEGE DUBLIN   (Ireland)

^b SERVICE DE PHYSIQUE DE L ETAT CONDENSÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; ELECTRON BEAM LITHOGRAPHY; MAGNETIC RELAXATION; MAGNETIZATION; PHONONS; SPURIOUS SIGNAL NOISE; THERMAL EFFECTS;

RANDOM TELEGRAPH NOISE (RTN);

ELECTROMIGRATION;

EID: 0038655348     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1556981     Document Type: Conference Paper

References (9)

1. J. J. Versluijs, M. A. Bari, and J. M. D. Coey, Phys. Rev. Lett. 87, 026601 (2001).
2. N. García, M. Muñoz, and Y. W. Zhao, Phys. Rev. Lett. 82, 2923 (1999).
3. See, for example, U. Behner, Annual Report TUD (1997) 108.
4. H. Park et al., Appl. Phys. Lett. 75, 301 (1999).
5. P. Bruno, Phys. Rev. Lett. 83, 2425 (1999).
6. J. M. D. Coey, L. Berger, and Y. Labaye, Phys. Rev. B 64, 020407(R) (2001).
7. K. S. Ralls and R. A. Buhrman, Phys. Rev. B 44, 5800 (1991).
8. G. Vignale and M. E. Flatté, Phys. Rev. Lett. 89, 098302 (2002).
9. Y. Labaye, L. Berger, and J. M. D. Coey, J. Appl. Phys. 91, 5341 (2002)