Time-resolved observation of Barkhausen avalanche in Co thin films using magneto-optical microscope magnetometer

Journal of Applied Physics

Volumn 93, Issue 10 2, 2003, Pages 6564-6566

  Kim, Dong Hyun ^a   Choe, Sug Bong ^a,b   Shin, Sung Chul ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

KERR MAGNETOOPTICAL EFFECT; MAGNETIC DOMAINS; MAGNETIZATION; MAGNETOELECTRIC EFFECTS; MAGNETOMETERS; POINT DEFECTS;

BARKHAUSEN AVALANCHE;

MAGNETIC THIN FILMS;

EID: 0038654117     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1557350     Document Type: Conference Paper

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