Performance and results of the reflection grating spectrometers on-board XMM-Newton

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4851, Issue 1, 2002, Pages 196-207

  Den Herder, J W ^a   Brinkman, A C ^a   Kahn, S M ^f   Branduardi Raymont, G ^b   Audard, M ^c   Behar, E ^f   Blustin, A ^b   Den Boggende, A J ^a   Cottam, J ^f   Erd, C ^d   Gabriel, C ^e   Gudel M ^c   Van der Heyden, K ^a   Kaastra, J S ^a   Kinkhabwala, A ^f   Leutenegger, M A ^f   Mewe, R ^a   Paerels, F B S ^f   Raassen, A J J ^a   Peterson, J R ^f   Pollock, A ^e   Rasmussen, A P ^f   Sako, M ^f   Santos Lleo, M ^e   Steenbrugge, K C ^a   Tamura, T ^a   De Vries, C P ^a   more..

^a SRON NETHERLANDS INSTITUTE FOR SPACE RESEARCH   (Netherlands)

^b UNIVERSITY COLLEGE LONDON   (United Kingdom)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

^d EUROPEAN SPACE AGENCY   (Netherlands)

^e EUROPEAN SPACE AGENCY   (Spain)

^f NONE

Author keywords

Reflection gratings; X ray instrumentation; XMM Newton

Indexed keywords

CHARGE COUPLED DEVICES; DIFFRACTION GRATINGS; ELECTROMAGNETIC DISPERSION; LIGHTING; OPTICAL RESOLVING POWER; X RAY APPARATUS;

REFLECTION GRATINGS;

SPECTROMETERS;

EID: 0038634614     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.461150     Document Type: Conference Paper

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