X-ray optics - New technologies at ESA

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4851, Issue 1, 2002, Pages 421-432

  Bavdaz, Marcos ^a   Peacock, Anthony ^a   Lehmann, Volker ^b   Beijersbergen, Marco ^c   Kraft, Stefan ^c  

^a EUROPEAN SPACE AGENCY   (Netherlands)

^b INFINEON TECHNOLOGIES AG   (Germany)

^c Cosine Research bv ^*  (Netherlands)

Author keywords

Micro channel plates; Micro machining; X ray astronomy; X ray optics

Indexed keywords

MICROMACHINING; MIRRORS; OBSERVATORIES; REMOTE SENSING; TELESCOPES; X RAY OPTICS;

GAZING INCIDENCE GEOMETRIES;

ASTROPHYSICS;

EID: 0038634546     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.461733     Document Type: Conference Paper

References (12)

1. Turner M.J.L., Watson M.G. (eds.), The Next Generation of X-ray Observatories, Special report XRA97/02, ISBN 0 9530183 0 X, 1997
2. M. Arnauld et al., X-ray Evolving Universe Spectroscopy - The XEUS Science Case, ESA-SP 1238 (2000)
3. J.A.M. Bleeker, et al, X-ray Evolving Universe Spectroscopy - Mission Summary, ESA-SP 1242 (2000)
4. M. Bavdaz, et al, SPIE Proc. Vol. 4138, p. 69, 2000
5. M. Beijersbergen, et al, SPIE proc, Vol 3765, p 452, (1999)
6. A.N. Brunton, et al, NIM A 431 (1999)
7. Nucl. Instr. Meth., (1999), 436, 1, 2 (and references therein)
8. M. Beijersbergen, et al, SPIE proc, Vol 4012, p. 218, (2000)
9. M. Bavdaz et al, SPIE proc, Vol 4496, p. 94, (2001)
10. ESA-SCI(2000)1
11. ESA BR-165 (2000)
12. V. Lehmann, The Electrochemistry of Silicon, Willey-VCH, (2002)