Neutron-electron scattering length deduced from Pendellösung interferometry in neutron Bragg reflections on silicon

Journal of Electron Spectroscopy and Related Phenomena

Volumn 129, Issue 2-3, 2003, Pages 315-317

  Sparenberg, J M ^a,b,c   Leeb, H ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

^c TRIUMF   (Canada)

Author keywords

Bragg reflection; Neutron charge radius; Neutron interferometry; Neutron electron scattering length; Silicon; Temperature factor

Indexed keywords

ELECTRON SCATTERING; INTERFEROMETRY; NEUTRON REFLECTION; SILICON; TEMPERATURE;

BRAGG REFLECTION;

NEUTRON SCATTERING;

EID: 0038616181     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(03)00084-7     Document Type: Article

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