Effects of composition control on crystallographic and magnetic characteristics of Ba ferrite films sputtered with the mixture of Xe, Kr, Ar, and O2 for recording media

Journal of Applied Physics

Volumn 81, Issue 8 PART 2A, 1997, Pages 4377-4379

  Noma, K ^a   Matsushita, N ^a   Nakagawa, S ^a   Naoe, M ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038600048     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364829     Document Type: Article

References (3)

1. K. Noma, N. Matsushita, S. Nakagawa, and M. Naoe, J. Appl. Phys. 79, 5970 (1996).
2. G. M. Turner, I. S. Falconer, B. W. James, and D. R. McKenzie, J. Appl. Phys. 65, 3671 (1989).
3. M. Naoe, Y. Hoshi, and S. Yamanaka, IEEE Trans. Magn. 16, 646 (1980).