Reliability considerations of III-nitride microelectronic devices

Microelectronics Reliability

Volumn 39, Issue 12, 1999, Pages 1737-1757

  Würfl, Joachim ^a   Abrosimova, Vera ^a,b   Hilsenbeck, Jochen ^a   Nebauer, Erich ^a   Rieger, Walter ^a,c   Tränkle, Günther ^a  

^a LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

^b Kopenicker Strasse 325b D 12555   (Germany)

^c INFINEON TECHNOLOGIES AUSTRIA AG   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038589745     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(99)00181-X     Document Type: Review

References (153)

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