Raman spectroscopy with simultaneous measurement of two orthogonally polarized Raman spectra

Journal of Raman Spectroscopy

Volumn 34, Issue 5, 2003, Pages 345-349

  Thomson, G A ^a   Baldwin, K J ^a   Batchelder, D N ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

Orthogonal polarizations; Raman microscopy; Rochon prism

Indexed keywords

MOLECULAR CRYSTALS; POLARIZATION; SILICON WAFERS;

MEASUREMENTS OF; ORTHOGONAL POLARIZATIONS; PERFORMANCE; POLARIZED COMPONENTS; POLARIZED RAMAN SPECTRA; RAMAN BANDS; RAMAN MICROSCOPE; RAMAN MICROSCOPY; ROCHA PRISM; SIMULTANEOUS MEASUREMENT;

RAMAN SCATTERING;

SILICON;

ARTICLE; LASER; MICROSCOPE; POLARIZATION; RAMAN SPECTROMETRY;

EID: 0038586487     PISSN: 03770486     EISSN: None     Source Type: Journal    
DOI: 10.1002/jrs.991     Document Type: Article

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