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Volumn 35, Issue 10, 1996, Pages 2938-2942

Automatic measurement of surface height with the interferoscope

Author keywords

Grazing incidence interferometry; Image processing; Interferometry; Interferoscope; Surface shape measurement

Indexed keywords


EID: 0038581816     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.600977     Document Type: Article
Times cited : (4)

References (13)
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  • 7
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    • R. Feitscher, H. Fritz, and K. Körner, "Interferometric flatness testing of silicon wafers," in Proc. Fringe 89 - 1st Int. Workshop on Automatic Processing of Fringe Patterns, W. Osten, R. J. Pryputniewicz, T. R. Reid, and H. Rottenkolber, Eds., pp. 57-61, Akademie vertag, Berlin (1989).
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  • 9
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    • Oblique incidence and observation electronic speckle pattern interferometry
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    • Increased sensitivity to in-plane displacements in electronic speckle pattern interferometry
    • C. Joenathan, A. Sohmer, and L. Bürkle, "Increased sensitivity to in-plane displacements in electronic speckle pattern interferometry," Appl. Opt. 34(16), 2880-2885 (1995).
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  • 11
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    • Chien, P.-Y.1    Chang, Y.-S.2    Chang, M.-W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.