SCOPUS 정보 검색 플랫폼

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 2, 2003, Pages 487-490

Experimental sampling distributions and confidence intervals of the Allan variance in some DC electrical measurements

(1) Witt, Thomas J a

a PAVILLON DE BRETEUIL (France)

Author keywords

Allan variance; Correlation; Noise measurement; Stochastic processes; Voltmeters

Indexed keywords

CORRELATION METHODS; DIGITAL VOLTMETERS; PROBABILITY DISTRIBUTIONS; RANDOM PROCESSES;

ALLAN VARIANCE; CHI-SQUARE DISTRIBUTION; DC ELECTRICAL MEASUREMENTS; NANOVOLTMETERS; NOISE MEASUREMENT; SAMPLING DISTRIBUTION; ZENER VOLTAGE STANDARDS;

ELECTRIC VARIABLES MEASUREMENT;

EID: 0038575714 PISSN: 00189456 EISSN: None Source Type: Journal
DOI: 10.1109/TIM.2003.811653 Document Type: Article

Times cited : (9)

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