Counting electrons one by one - Overview of a Joint European Research project

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 2, 2003, Pages 584-589

  Van Den Brom, Helko E ^a   Kerkhof, Oswin ^a   Lotkhov, Sergey V ^b   Bogoslovsky, Sergey A ^b   Willenberg, Gerd Dietmar ^b   Scherer, Hansjörg ^b   Zorin, Alexander B ^b   Pedersen, S ^c   Kristoffersson, C ^c   Aassime, A ^c   Delsing, Per ^c   Taslakov, Marian A ^d   Ivanov, Z ^d   Nilsson, Håkan ^d   Giblin, Stephen ^e   Kleinschmidt, Peter ^e   Hof, Christian ^f   Eichenberger, Ali L ^f   Overney, Frédéric ^f   Jeanneret, Blaise ^f   Geneves G ^g   Feltin, Nicloas ^g   Devoille, Laurent ^g   Gay, F ^g   Piquemal, François P M ^g   more..

^a NMi Van Swinden Laboratorium   (Netherlands)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^c CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^d SP TECHNICAL RESEARCH INSTITUTE OF SWEDEN   (Sweden)

^e NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^f SFOMA   (Switzerland)

^g LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE   (France)

Author keywords

Capacitance; Charge transfer; Current measurement; Single electron counter; Single electron pump; Tunnel transistor

Indexed keywords

CAPACITANCE; CAPACITORS; CHARGE TRANSFER; CRYOGENICS; ELECTRON TUNNELING; RESISTORS; RESONANT CIRCUITS; SEMICONDUCTOR COUNTERS; TRANSISTORS;

CRYOGENIC CAPACITOR; ELECTRON COUNTER; ELECTRON PUMP;

ELECTRIC CURRENT MEASUREMENT;

EID: 0038575701     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.810736     Document Type: Article

References (9)

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