Nanotribological studies of chromium thin films

Tribology Letters

Volumn 13, Issue 4, 2002, Pages 255-261

  Wei, G ^a   Weaver, M L ^a   Barnard, J A ^b  

^a UNIVERSITY OF ALABAMA   (United States)

^b PA 15260   (United States)

Author keywords

Atomic force microscopy (AFM); Nanoscratch; Nanotribology; Thin films

Indexed keywords

TRIBOLOGY;

EID: 0038556937     PISSN: 10238883     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1021301609386     Document Type: Article

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