Simulation of transmission electron microscopy images during tensile fracture of metal foils

Materials Science and Engineering: A

Volumn 350, Issue 1-2, 2003, Pages 207-215

  Satoh, Y ^a   Yoshiie, T ^a   Matsukawa, Y ^b   Kiritani, M ^b  

^a KYOTO UNIVERSITY   (Japan)

^b HIROSHIMA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Computer simulation; EAM potential; Fracture; Phase transformation; Plastic deformation; TEM

Indexed keywords

ELASTICITY; FRACTURE TOUGHNESS; STRAIN MEASUREMENT; TENSILE STRENGTH; TRANSMISSION ELECTRON MICROSCOPY;

EMBEDDED ATOM METHOD (EAM);

METAL FOIL;

ELECTRON MICROSCOPY; METAL; PLASTIC DEFORMATION; TENSILE CRACK;

EID: 0038548460     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(02)00725-6     Document Type: Article

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