Analysis of different measurement setups for a programmable Josephson voltage standard

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 2, 2003, Pages 524-528

  Behr, Ralf ^a   Kohlmann, Johannes ^a   Janssen, Jan Theodor B M ^b   Kleinschmidt, Peter ^b   Williams, Jonathan M ^b   Djordjevic, Sophie ^c   Lo Hive, Jean Pierre ^c   Piquemal, François ^c   Hetland, Per Otto ^d   Reymann, Dominique ^e   Eklund, Gunnar ^f   Hof, Christian ^g   Jeanneret, Blaise ^g   Chevtchenko, Oleg ^h   Houtzager, Ernest ^h   Van Den Brom, Helko E ^h   Sosso, Andrea ⁱ   Andreone, Domenico ⁱ   Nissilä, Jaani ^j   Helistö, Panu ^k  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^c LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE   (France)

^d Justervesenet   (Norway)

^e PAVILLON DE BRETEUIL   (France)

^f SP TECHNICAL RESEARCH INSTITUTE OF SWEDEN   (Sweden)

^g SFOMA   (Switzerland)

^h NMi Van Swinden Laboratorium   (Netherlands)

ⁱ ISTITUTO ELETTROTECNICO NAZIONALE GALILEO FERRARIS   (Italy)

^j MIKES   (Finland)

^k VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

more..

Author keywords

Comparison; Josephson arrays; Programmable voltage standard; Superconductor insulator normal conductor insulator superconductor (SINIS); Superconductor insulator superconductor (SIS) Josephson junctions

Indexed keywords

ARRAYS; CALIBRATION; ELECTRIC INSULATORS; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS); VOLTAGE MEASUREMENT;

MICROWAVE FREQUENCIES; PROGRAMMABLE JOSEPHSON ARRAYS; PROGRAMMABLE VOLTAGE STANDARD;

JOSEPHSON JUNCTION DEVICES;

EID: 0038546755     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.811570     Document Type: Article

References (18)

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