X-ray absorption spectroscopy of silicates for in situ, sub-micrometer mineral identification

American Mineralogist

Volumn 88, Issue 5, 2003, Pages 763-769

  Gilbert, B ^a   Frazer, B H ^a,b   Naab, F ^c   Fournelle, J ^a   Valley, J W ^a   De Stasio, G ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

^b EPFL   (Switzerland)

^c UNIVERSITY OF NOTRE DAME   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISPERSIVE X RAY ANALYSIS; SILICATE MINERALS; SILICON; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY DIFFRACTION ANALYSIS; ZIRCON;

ABSORPTION EDGES; ALUMINOSILICATE MINERALS; ENERGY DERIVATIVES; MINERAL IDENTIFICATION; NEAREST NEIGHBORS; SPECTRAL LINESHAPES; SPECTROMICROSCOPY; X-RAY PHOTOELECTRONS;

MICROMETERS;

ALUMINOSILICATE; IDENTIFICATION METHOD; MINERALOGY; SILICATE MINERAL; X-RAY SPECTROSCOPY;

EID: 0038544678     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-2003-5-605     Document Type: Article

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