Grazing-incidence small-angle X-ray scattering and X-ray diffraction from magnetic clusters obtained by Co + Ni sequential ion implantation in silica

Journal of Applied Crystallography

Volumn 36, Issue 3 I, 2003, Pages 732-735

  Maurizio, C ^a,e   Longo, A ^b   Martorana, A ^c   Cattaruzza, E ^d   D'Acapito, F ^e   Gonella, F ^d   De Julian, C ^a   Mattei, G ^a   Mazzoldi, P ^a   Padovani, S ^a   Boeseckef, P ^e  

^a UNIVERSITY OF PADOVA   (Italy)

^b CNR   (Italy)

^c UNIVERSITY OF PALERMO   (Italy)

^d INFM   (Italy)

^e EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Co Ni implantation in silica; Grazing incidence X ray diffraction; Ion implantation; Magnetic clusters; Nanoclusters

Indexed keywords

COBALT; GLASS; NICKEL; SILICON DIOXIDE;

CONFERENCE PAPER; CRYSTAL STRUCTURE; MAGNETISM; NANOPARTICLE; PARTICLE SIZE; RADIATION SCATTERING; TECHNIQUE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 0038542885     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889803006137     Document Type: Conference Paper

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