Refraction and reflection of diffusion fronts

Physical Review Letters

Volumn 90, Issue 14, 2003, Pages

  Remhof, A ^a   Wijngaarden, R J ^a   Griessen, R ^a  

^a VU UNIVERSITY AMSTERDAM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; ENTHALPY; EVAPORATION; HYDROGEN; MULTILAYERS; OXIDES; PROFILOMETRY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SOLUBILITY; ULTRAHIGH VACUUM; VANADIUM; YTTRIUM;

DIFFUSION FRONTS; ELECTRON BEAM EVAPORATION; HYDROGEN AFFINITY; OPTICAL INDICATOR; THIN VANADIUM LAYERS; TWO DIMENSIONAL MIGRATION; WATER COOLED QUARTZ MICROBALANCE;

DIFFUSION;

EID: 0038541949     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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