The use of a spherically curved crystal spectrometer for X-ray measurements on electron beam ion trap

Physica Scripta

Volumn 58, Issue 2, 1998, Pages 178-181

  Aglitskiy, Y ^a,d   Serpa, F G ^a,e   Meyer, E S ^a   Gillaspy, J D ^a   Brown, C M ^b   Faenov, A Ya ^c   Pikuz, T A ^c  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c Multicharged Ions Spectra Data Center of VNIIFTRI   (Russian Federation)

^d SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

^e UNIVERSITY OF NOTRE DAME   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038529034     PISSN: 00318949     EISSN: None     Source Type: Journal    
DOI: 10.1088/0031-8949/58/2/012     Document Type: Article

References (11)

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