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Volumn 36, Issue 22 SPEC.ISS., 2003, Pages 6235-6241
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Impurity screening in strongly coupled plasma systems
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0038516560
PISSN: 03054470
EISSN: None
Source Type: Journal
DOI: 10.1088/0305-4470/36/22/353 Document Type: Conference Paper |
Times cited : (5)
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References (19)
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