Refraction effects on x-ray and ultraviolet interferometric probing of laser-produced plasmas

Journal of the Optical Society of America B: Optical Physics

Volumn 20, Issue 1, 2003, Pages 254-259

  Smith, Raymond F ^a   Dunn, James ^a   Nilsen, Joseph ^a   Hunter, James R ^a   Shlyaptsev, Vyacheslev N ^b   Rocca, Jorge J ^c   Filevich, Jorge ^c   Marconi, Mario C ^c,d  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c Engineering Research Center and Hydraulics Laboratory   (United States)

^d UNIVERSIDAD DE BUENOS AIRES   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; LIGHT REFRACTION; PLASMA PROBES; RAY TRACING; ULTRAVIOLET RADIATION; X RAYS;

ULTRAVIOLET PROBES;

LASER PRODUCED PLASMAS;

EID: 0038513405     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.20.000254     Document Type: Article

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