Multidimensional constrained test assembly

Applied Psychological Measurement

Volumn 26, Issue 2, 2002, Pages 133-146

  Veldkamp, Bernard P ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Greedy heuristic; Linear approximation; Mathematical programming; Multidimensional IRT; Optimal test assembly; Test design

Indexed keywords

EID: 0038510208     PISSN: 01466216     EISSN: None     Source Type: Journal    
DOI: 10.1177/01421602026002002     Document Type: Article

References (25)

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