Field-effect trap-level-distribution model of dynamic random access memory data retention characteristics

Journal of Applied Physics

Volumn 81, Issue 10, 1997, Pages 7053-7060

  Hiraiwa, A ^a   Ogasawara, M ^a   Natsuaki, N ^a   Itoh, Y ^a   Iwai, H ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038509095     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365227     Document Type: Article

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