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Volumn 62, Issue 6, 2003, Pages 815-821

Wetting at curved substrates: Non-analytic behavior of interfacial properties

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EID: 0038507633     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i2003-00445-5     Document Type: Article
Times cited : (40)

References (26)
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    • Since the upper critical dimension for complete wetting with power law potentials is < 3, fluctuations are not important in this case
    • Since the upper critical dimension for complete wetting with power law potentials is < 3, fluctuations are not important in this case.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.