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Volumn 2, Issue , 2003, Pages 946-950
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Uncertainty specification for Data Acquisition Devices (DAQ)
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NONE
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Author keywords
Calibration; Coverage Factor; Expanded Uncertainty ADQ; Statistics; Uncerta inty
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Indexed keywords
ANALOG TO DIGITAL CONVERSION;
CALIBRATION;
MEASUREMENT THEORY;
STATISTICAL METHODS;
COSTS;
DATA ACQUISITION;
INSTRUMENTS;
LABORATORIES;
MANUFACTURE;
SPECIFICATIONS;
STANDARDS;
TIME MEASUREMENT;
EXPANDED UNCERTAINTY;
COVERAGE FACTORS;
DATA-ACQUISITION DEVICES;
IEC STANDARDS;
MEASUREMENT STANDARDS;
MEASUREMENT UNCERTAINTY;
DATA ACQUISITION;
UNCERTAINTY ANALYSIS;
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EID: 0038498014
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (4)
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References (5)
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