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Volumn 1, Issue , 2003, Pages

An auto-input-offset removing floating gate pseudo-differential transconductor

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFICATION; CMOS INTEGRATED CIRCUITS; ELECTRETS; ELECTRON TUNNELING; MICROPHONES;

EID: 0038496831     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (17)

References (9)
  • 2
    • 0029705551 scopus 로고    scopus 로고
    • An autozeroing amplifier using pFET hot-electron injection
    • Atlanta, GA, May
    • P. Hasler, B. A. Minch, C. Diorio and C. Mead, "An Autozeroing Amplifier using pFET Hot-Electron Injection," in Proc. IEEE ISCAS 1996, Atlanta, GA, May 1996, Vol. 3, pp.325-328.
    • (1996) Proc. IEEE ISCAS 1996 , vol.3 , pp. 325-328
    • Hasler, P.1    Minch, B.A.2    Diorio, C.3    Mead, C.4
  • 6
    • 0037776428 scopus 로고    scopus 로고
    • United States Patent No. 5,986,927, Minch, et al., November 16, 1999
    • United States Patent No. 5,986,927, Minch, et al., November 16, 1999.
  • 7
    • 0026173510 scopus 로고
    • Review of carrier injection into the silicon/silicon-dioxide system
    • June
    • J. J. Sanchez and T. A. DeMassa, "Review of carrier injection into the silicon/silicon-dioxide system," IEE proceedings - G, June 1991, Vol. 138, No. 3.
    • (1991) IEE Proceedings - G , vol.138 , Issue.3
    • Sanchez, J.J.1    Demassa, T.A.2
  • 8
    • 0033681591 scopus 로고    scopus 로고
    • Calibration and matching of floating gate devices
    • Geneva, Switzerland, May
    • W. P. Millard, Z. K. Kalayjian and A. G. Andreou, "Calibration and Matching of Floating Gate Devices," in Proc. IEEE ISCAS 2000, Geneva, Switzerland, May 2000, Vol. 4, pp.389-392.
    • (2000) Proc. IEEE ISCAS 2000 , vol.4 , pp. 389-392
    • Millard, W.P.1    Kalayjian, Z.K.2    Andreou, A.G.3
  • 9
    • 21544458715 scopus 로고
    • Impact ionization, trap creation, degradation, and breakdown in silicon dioxide films on silicon
    • April
    • D. J. DiMaria, E. Cartier, D. Arnold, "Impact ionization, trap creation, degradation, and breakdown in silicon dioxide films on silicon," Journal of Applied Physics, April 1993, Vol. 73, pp. 3367-3384.
    • (1993) Journal of Applied Physics , vol.73 , pp. 3367-3384
    • DiMaria, D.J.1    Cartier, E.2    Arnold, D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.