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Volumn 4, Issue , 2000, Pages 2412-2416

Improved technique for fault detection sensitivity in transformer impulse test

Author keywords

Power spectral density; Signature analysis; Transformer; Wavelets

Indexed keywords

ELECTRIC FAULT LOCATION; ELECTRIC INSULATION; IMPULSE TESTING; NUMERICAL METHODS; SHORT CIRCUIT CURRENTS; TRANSFER FUNCTIONS; WAVELET TRANSFORMS;

EID: 0038491617     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (12)

References (12)
  • 1
    • 20344384411 scopus 로고    scopus 로고
    • Guide for transformers impulse tests
    • IEEE C57.98-1993
    • IEEE C57.98-1993. Guide for transformers impulse tests.
  • 2
    • 0018038144 scopus 로고
    • Transformer diagnostic testing by frequency response analysis
    • December
    • E. P. Dick, and C. C. Erven, "Transformer diagnostic testing by frequency response analysis," IEEE Transactions on Power, Apparatus and Systems, Vol. 97, No. 6, pp. 2144-2153, December 1978.
    • (1978) IEEE Transactions on Power, Apparatus and Systems , vol.97 , Issue.6 , pp. 2144-2153
    • Dick, E.P.1    Erven, C.C.2
  • 4
    • 0033207342 scopus 로고    scopus 로고
    • Monotoring of power transformers using transfer function method
    • October
    • T. Leibfried, "Monotoring of power transformers using transfer function method," IEEE Transactions on Power Delivery, Vol. 14, No. 4, pp. 1333-1341, October 1999.
    • (1999) IEEE Transactions on Power Delivery , vol.14 , Issue.4 , pp. 1333-1341
    • Leibfried, T.1
  • 11
    • 0026239193 scopus 로고
    • Wavelets and signal processing
    • October
    • O. Rioul, and M. Vetterli, "Wavelets and signal processing," IEEE SP Magazine, pp. 14-38, October 1991.
    • (1991) IEEE SP Magazine , pp. 14-38
    • Rioul, O.1    Vetterli, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.