New Ge-Sn materials with adjustable bandgaps and lattice constants

Materials Research Society Symposium - Proceedings

Volumn 744, Issue , 2002, Pages 49-54

  Bauer, Matthew R ^a   Tolle, John ^a   Chizmeshya, A V G ^a   Zollner, S ^b   Menendez, J ^a   Kouvetakis, J ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTAL STRUCTURE; ENERGY GAP; HYDRIDES; LATTICE CONSTANTS; OPTICAL PROPERTIES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING SILICON; SYNTHESIS (CHEMICAL); THERMODYNAMIC STABILITY; TRANSMISSION ELECTRON MICROSCOPY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INFRARED SEMICONDUCTOR; LOW-ENERGY SECONDARY ION MASS SPECTROMETRY; ULTRA HIGH VACUUM CHEMICAL VAPOR DEPOSITION;

GERMANIUM ALLOYS;

EID: 0038488647     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-744-m2.5     Document Type: Conference Paper

References (11)

1. G. He, H. A. Atwater, Phys. Rev. Lett. 79, 1937 (1997).
2. D. W. Jenkins and J. D. Dow, Phys. Rev. B 36, 7994 (1987).
3. O. Gurdal, R. Desjardins, J. R. A. Carlsson, N. Taylor, H. H. Radamson, J.-E. Sundgren, J. E. Greene, J. Appl. Phys 83, 162 (1998).
4. Bull. Alloy Phase Diagrams 5, 266 (1984) and references therein.
5. M. T. Asom, E. A. Fitzgerald, A. R. Kortan, B. Spear, L. C. Kimerling, Appl. Phys. Lett. 55, 578 (1989).
6. W. Wegscheider, J. Olajos, U. Menczigar, U. Dondl, G. Abstreiter, J. Cryst. Growth 132, 75 (1992).
7. J. Taraci, J. Tolle, J. Kouvetakis, M. R. McCartney, D.J. Smith, J. Menendez, and M. A. Santana, Appl. Phys. Lett. 78, 3607 (2001).
8. W. Richter, "Resonant Raman Scattering in Semiconductors", in Springer Tracts in Modern Physics, Hohler, G. Ed. Springer-Verlag: New York, Vol. 78, p 121 (1976).
9. F. Cerdeira, W. Dreyrodt, and M. Cardona, Solid. State Comm. 10, 591 (1972).
10. L. Vina, H. Hochst and M. Cardona, Phys. Rev. B 31, 958 (1985).
11. J. Humlicek, M. Garriga, M.I. Alonso, and M. Cardona, J. Appl. Phys. 65, 2827 (1989).