Accelerated life test calculations using the method of maximum likelihood: An improvement over least squares

Microelectronics Reliability

Volumn 43, Issue 6, 2003, Pages 859-864

  Whitman, Charles S ^a  

^a RF MICRO DEVICES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; LEAST SQUARES APPROXIMATIONS; MAXIMUM LIKELIHOOD ESTIMATION;

RELIABILITY CALCULATIONS;

MICROELECTRONICS;

EID: 0038486182     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(03)00071-4     Document Type: Conference Paper

References (6)

1. Guidelines for GaAs MMIC and FET Life Testing. JEDEC Publication JEP118, 1993, Available from: www.jedec.org.
2. Scarpulla J, Eng D, Leung D. A better way to predict reliability from lifetest data using a regression technique. Proc GaAs MANTECH Conference, 2000. p. 125-8.
3. Snedecor G.W., Cochran W.G. Statistical methods. 8th ed:1989;Iowa State University Press, Ames IA. p. 173-4.
4. Casella G., Berger L. Statistical inference. 1990;Duxbury Press, Belmont CA. p. 253.
5. Tobias P.A., Trindade D.C. Applied reliability. 2nd ed:1990;Chapman & Hall, New York. p. 94-6.
6. Nelson W. Applied life data analysis. 1982;John Wiley & Sons. p. 213-404.