Wetting tension due to Coulombic interaction in charge-related wetting phenomena

Langmuir

Volumn 19, Issue 13, 2003, Pages 5407-5412

  Kang, Kwan Hyoung ^a   Kang, In Seok ^a   Lee, Choung Mook ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; DIELECTRIC MATERIALS; ELECTRIC CHARGE; ELECTROSTATICS; FREE ENERGY; NUMERICAL METHODS; OSMOSIS; SOLIDS; SUBSTRATES; SURFACES; THERMODYNAMICS; WETTING;

CHARGE RELATED WETTING PHENOMENA; COULOMBIC INTERACTION; DROPLETS; EDGE EFFECT; ELECTROCAPILLARY; ELECTROMECHANICS; MAXWELL STRESS; WETTING TENSION;

ELECTROCHEMISTRY;

EID: 0038481645     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la034163n     Document Type: Article

References (24)

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22. 13 dx which cannot be simplified further. Here, we neglect the influence of specifically adsorbed ionic species for brevity of formula and more clear comparison with the thermodynamic result.
23. The change of the interface shape around TCL can give rise to an additional change of the (excess) electrostatic free energy of the system. This should be accounted for on the basis of the line tension effect, which is beyond the scope of the present investigation.
24. 0 which is equivalent to the last term of eq 11, but with different sign.