Andreev reflections on Y1-xCaxBa2Cu3O7-δ: Evidence for an unusual proximity effect

Physical Review Letters

Volumn 90, Issue 20, 2003, Pages

  Kohen, A ^a   Leibovitch, G ^a   Deutscher, G ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALCULATIONS; ELECTRON REFLECTION; ELECTRON SPECTROSCOPY; ELECTRON TUNNELING; FERMI LEVEL; FILM GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; SCANNING ELECTRON MICROSCOPY; SPUTTERING; THIN FILMS; X RAY CRYSTALLOGRAPHY;

ANDREEV REFLECTION; CRITICAL TEMPERATURE; ELECTRON-ELECTRON INTERACTION;

OXIDE SUPERCONDUCTORS;

EID: 0038452502     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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