Energy-filtered high-resolution electron microscopy for quantitative solid state structure determination

Journal of Research of the National Institute of Standards and Technology

Volumn 102, Issue 1, 1997, Pages 1-12

  Wang, Z L ^a   Van Heerden, D ^a   Josell, D ^a   Shapiro, A J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Al Ti; Composition sensitive imaging; Electron energy loss spectrosocpy; Energy filtering; High resolution electron microscopy, Ni Ti

Indexed keywords

EID: 0038447713     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.102.002     Document Type: Article

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