SCOPUS 정보 검색 플랫폼

Volumn 10, Issue 1, 2003, Pages 57-61

Effect of interactions at the cofired interface of electrode/ceramics on the reliability of lead-based multilayer ceramic capacitors

(3) Cao, Jiang Li a Gui, Zhi Lun a Li, Long Tu a

a TSINGHUA UNIVERSITY (China)

Author keywords

Diffusion; Electrical properties; Ferroelectrics; Interface; Reliability

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CERAMIC CAPACITORS; COMPOSITION EFFECTS; DIFFUSION IN SOLIDS; DOPING (ADDITIVES); ELECTRIC PROPERTIES; ELECTRODES; FIRING (OF MATERIALS); INTERFACES (MATERIALS); LEAD COMPOUNDS; RELIABILITY; TRANSMISSION ELECTRON MICROSCOPY;

COFIRED INTERFACE; LEAD MAGNESIUM NIOBATE; TEMPERATURE HUMIDITY BIAS TESTS;

FERROELECTRIC MATERIALS;

EID: 0038446050 PISSN: 13853449 EISSN: None Source Type: Journal
DOI: 10.1023/A:1024032125688 Document Type: Article

Times cited : (5)

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