Calibrated thermal microscopy of the tool-chip interface in machining

Machining Science and Technology

Volumn 7, Issue 2, 2003, Pages 167-190

  Davies, M A ^a   Yoon, H ^b   Schmitz, T L ^b   Burns, T J ^b   Kennedy, M D ^b  

^a University of North Carolina at Charlotte   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; COMPUTER SIMULATION; DIAMONDS; FINITE DIFFERENCE METHOD; INFRARED IMAGING; INTERFACES (MATERIALS); MACHINE TOOLS; MICROSCOPIC EXAMINATION; REFLECTION; STEEL; TEMPERATURE MEASUREMENT;

THERMAL MICROSCOPY;

MACHINING;

EID: 0038443510     PISSN: 10910344     EISSN: None     Source Type: Journal    
DOI: 10.1081/MST-120022776     Document Type: Article

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