Radiation hardened CMOS/SOS

IEEE Transactions on Nuclear Science

Volumn 22, Issue 6, 1975, Pages 2181-2184

  Aubuchon, K G ^a   Harari, E ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038428103     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1975.4328101     Document Type: Article

References (4)

1. K. M. Schlesier, IEEE Trans. Nucl. Sci., NS-21, 152 (Dec. 1974).
2. R. A. Kjar, J. Peel, IEEE Trans. Nucl. Sci., NS-21, 208 (Dec. 1974).
3. K. G. Aubuchon, E. Harari, D. H. Leong, C. P. Chang, IEEE Trans.Nucl. Sci., NS-21, 167, (Dec. 1974).
4. D. Neaman, W. Shedd, B. Buchanan, IEEE Trans. Nucl. Sci., NS-21, 211, (Dec. 1974).