Stable nanostructuring of ultrathin porous silicon films by scanning tunneling microscopy

Journal of Applied Physics

Volumn 79, Issue 6, 1996, Pages 2948-2953

  Enachescu, M ^a,c   Hartmann, E ^b   Koch, F ^b  

^a UNIVERSITY OF MAINE   (United States)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c UNIVERSITY OF BUCHAREST   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038420328     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361291     Document Type: Article

References (36)

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