Concurrent optimization of process dependent variations in different circuit performance measures

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 4, Issue , 2003, Pages

  Mutlu, Ayhan A ^a   Gunther, Norman G ^a   Rahman, Mahmud ^a  

^a Santa Clara University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; FUZZY SETS; MEMBERSHIP FUNCTIONS; OPTIMIZATION; SPECIFICATIONS;

LATIN HYPERCUBE SAMPLING (LHS);

DELAY CIRCUITS;

EID: 0038419540     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

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2. N. Shigyo, "An Analysis of Process Fluctuation Induced Propagation Delay Variation using Analytical Model", Solid-State Electronics, vol. 44, pp. 2183-2191, 2000.
3. M. Keramat, and R. Kielbasa, "Worst Case Efficiency Latin Hypercube Sampling Monte Carlo (LHSMC) Yield Estimator of Electrical Circuits", Proc. of IEEE Intl. Symposium on Circuits and Systems, pp. 1660-1664, Hong Kong, June 1997.
4. P. Cox, P. Yang, S.S. Mahant-Shetti, and P. Chatterjee, "Statistical modeling for efficient parametric yield estimation of MOS VLSI circuit," IEEE Trans. on Electron Devices, Vol. ED-32, no. 2, pp. 471-478, Feburary 1985.
5. J. Zhang, M. Styblinski, Yield and Variability Optimization of Integrated Circuits, Kluwer Academic Publishers, Boston, Publishers. 1995.