Process variation dimension reduction based on SVD

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 4, Issue , 2003, Pages

  Li, Zhuo ^a   Lu, Xiang ^a   Shi, Weiping ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATION THEORY; PRINCIPAL COMPONENT ANALYSIS; TIMING CIRCUITS;

SINGULAR VALUE DECOMPOSITION (SVD);

INTEGRATED CIRCUIT MANUFACTURE;

EID: 0038419536     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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