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Volumn 254, Issue 9, 2003, Pages 924-929

Nanofriction of silicon oxide surfaces covered with thin water films

Author keywords

Atomic force microscopy; Hydrophilic; Hydrophobic; Nanotribology; Nanowear; Silicon oxide; Water film

Indexed keywords

FRICTION; INTERFACIAL ENERGY; SILICON COMPOUNDS; THIN FILMS; TRIBOLOGY; ULTRAHIGH VACUUM;

EID: 0038417510     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0043-1648(03)00248-5     Document Type: Article
Times cited : (32)

References (22)
  • 2
    • 0031707293 scopus 로고    scopus 로고
    • Surface processes in MEMS technology
    • Maboudian R.Surface processes in MEMS technology Surf. Sci. Rep. 30 1998 207
    • (1998) Surf. Sci. Rep. , vol.30 , pp. 207
    • Maboudian, R.1
  • 7
    • 0036783681 scopus 로고    scopus 로고
    • Transitional microfriction behavior of silicon induced by spontanous water adsorption
    • R.A. Nevchupa, M. Scherge, S.I.-U. Ahmed, Transitional microfriction behavior of silicon induced by spontanous water adsorption, Surf. Sci. 517 (2002) 17.
    • (2002) Surf. Sci. , vol.517 , pp. 17
    • Nevchupa, R.A.1    Scherge, M.2    Ahmed, S.I.-U.3
  • 14
  • 17
    • 84934701192 scopus 로고
    • Ueber die Berührung fester elastischer Körper
    • Hertz H.Ueber die Berührung fester elastischer Körper J. Reine Angew. Math. 92 1881 156
    • (1881) J. Reine Angew. Math. , vol.92 , pp. 156
    • Hertz, H.1
  • 19
    • 0030496087 scopus 로고    scopus 로고
    • Effect of capillary force on friction force microscopy: A scanning hydrophilicity microscope
    • Fujihira M.Aoki D.Okabe Y.Takano H.Hokari H.Effect of capillary force on friction force microscopy: a scanning hydrophilicity microscope Chem. Lett. 7 1996 499
    • (1996) Chem. Lett. , vol.7 , pp. 499
    • Fujihira, M.1    Aoki, D.2    Okabe, Y.3    Takano, H.4    Hokari, H.5
  • 20
    • 0343953391 scopus 로고    scopus 로고
    • Nanotribology of clean and oxide-covered silicon surfaces using atomic force microscopy
    • Moon W.C.Contera S.A.Yoshinobu T.Iwasaki H.Nanotribology of clean and oxide-covered silicon surfaces using atomic force microscopy Jpn. J. Appl. Phys. 39 2000 272
    • (2000) Jpn. J. Appl. Phys. , vol.39 , pp. 272
    • Moon, W.C.1    Contera, S.A.2    Yoshinobu, T.3    Iwasaki, H.4
  • 21
    • 0035139699 scopus 로고    scopus 로고
    • Nanotribology of Si oxide layers on Si by atomic force microscopy
    • Moon W.C.Yoshinobu T.Iwasaki H.Nanotribology of Si oxide layers on Si by atomic force microscopy Ultramicroscopy 86 2001 49
    • (2001) Ultramicroscopy , vol.86 , pp. 49
    • Moon, W.C.1    Yoshinobu, T.2    Iwasaki, H.3
  • 22
    • 0028731053 scopus 로고
    • 2-SiC interface and oxidation of 6H SiC single crystal Si-(0 0 1) and C-(0 0 1) surface
    • 2-SiC interface and oxidation of 6H SiC single crystal Si-(0 0 1) and C-(0 0 1) surface J. Mater. Res. 9 1994 3088
    • (1994) J. Mater. Res. , vol.9 , pp. 3088
    • Hornetz, B.1    Michel, H.-J.2    Halbritter, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.