Cold neutron depth profiling of lithium-ion battery materials

Journal of Power Sources

Volumn 119-121, Issue , 2003, Pages 680-685

  Lamaze, G P ^a   Chen Mayer, H H ^a   Becker, D A ^a   Vereda, F ^b   Goldner, R B ^b   Haas, T ^b   Zerigian, P ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b TUFTS UNIVERSITY   (United States)

Author keywords

Batteries; Depth profiling; LiCoO2; LiPON; Lithium; Nitrogen

Indexed keywords

ION BEAM ASSISTED DEPOSITION; NEUTRON IRRADIATION; NONDESTRUCTIVE EXAMINATION; PROFILOMETRY; THERMAL STRESS; THERMOANALYSIS; THIN FILM DEVICES;

NEUTRON DEPTH PROFILING (NDP);

LITHIUM BATTERIES;

EID: 0038408549     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0378-7753(03)00232-5     Document Type: Conference Paper

References (9)

1. Bates J.B., Dudney N.J., Gruzalzki G.R., Zuhr R.A., Choudhury A., Luck C.F., Robertson J.D. Solid State Ionics. 53-56:1992;647.
2. Yu X., Bates J.B., Jellison G.E., Hart F.X. J. Electrochem. Soc. 144:1997;524.
3. Vereda F., Clay N., Gerouki A., Goldner R.B., Haas T., Zerigian P. J. Power Sources. 89:2000;201-205.
4. Goldner R.B., Zerigian P., Liu T.Y., Clay N., Vereda F., Haas T.E. Electrochem. Soc. Proc. 98(15):1999;268.
5. Downing R.G., Lamaze G.P., Langland J.K., Hwang S.T. NIST J. Res. 98:1993;109.
6. Lamaze G.P., Chen-Mayer H.H., Gerouki A., Goldner R.B. Surf. Interface Anal. 29:2000;637-641.
7. Roh N.S., Lee S.D., Kwon H.S. Scripta Mater. 42:2000;43-49.
8. Wang B., Chakoumakos C., Sales B.C., Kwak B.S., Bates J.B. J. Solid State Chem. 115:1995;313-323.
9. Goldner R.B., Haas T.E., Arntz F.O., Slaven S., Wong K.K., Wilkens B., Shepard C., Lanford W. Appl. Phys. Lett. 62:1993;1699.