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Volumn 53, Issue 1-3, 1996, Pages 278-283

A CMOS-compatible 2-D vertical Hall magnetic-field sensor using active carrier confinement and post-process micromachining

Author keywords

Carrier confinement; CMOS; Hall devices; Magnetic field sensors; Micromachining

Indexed keywords


EID: 0038407863     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/0924-4247(96)01160-0     Document Type: Article
Times cited : (20)

References (17)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.