Spatial point pattern analysis by using Voronoi diagrams and Delaunay tessellations - A comparative study

Biometrical Journal

Volumn 45, Issue 3, 2003, Pages 367-376

  Chiu, S N ^a  

^a HONG KONG BAPTIST UNIVERSITY   (Hong Kong)

Author keywords

Complete spatial randomness; Delaunay tessellation; Goodness of fit; Spatial point pattern; Voronoi diagram

Indexed keywords

GRAPHIC METHODS; RANDOM PROCESSES;

CLUSTERINGS; COMPARATIVES STUDIES; COMPLETE SPATIAL RANDOMNESS; DELAUNAY TESSELLATIONS; DELAUNAY TRIANGLES; EXTRACT INFORMATIONS; GOODNESS OF FIT; SPATIAL POINT PATTERN; SPATIAL POINT PATTERN ANALYSIS; VORONOI DIAGRAMS;

COMPUTATIONAL GEOMETRY;

EID: 0038401281     PISSN: 03233847     EISSN: None     Source Type: Journal    
DOI: 10.1002/bimj.200390018     Document Type: Article

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