Surface diffraction on magnetic nanostructures in thin films using grazing incidence SANS

Physica B: Condensed Matter

Volumn 335, Issue 1-4, 2003, Pages 54-58

  Pannetier, M ^a   Ott, F ^b   Fermon, C ^b   Samson, Y ^c  

^a SERVICE DE PHYSIQUE DE L ETAT CONDENSÉ   (France)

^b CNRS   (France)

^c CEA GRENOBLE   (France)

Author keywords

GISANS; Neutron; Reflectivity; Surface diffraction

Indexed keywords

IRON COMPOUNDS; MAGNETIC ANISOTROPY; MAGNETIC FIELDS; NANOSTRUCTURED MATERIALS; NEUTRON DIFFRACTION; NEUTRON SCATTERING;

BORN APPROXIMATION;

MAGNETIC THIN FILMS;

EID: 0038382941     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(03)00190-X     Document Type: Conference Paper

References (16)

1. Majkrzak C.F., Cable J.W., Kwo J., Hong M., McWhan D.B., Yafet Y., Waszcak J. Phys. Rev. Lett. 56:1986;2700 Felcher G.P., Hilleke R.O., Crawford R.K., Haumann J., Kleb R., Ostrowski G. Rev. Sci. Instr. 58:1987;609.
2. Majkrzak C.F., Cable J.W., Kwo J., Hong M., McWhan D.B., Yafet Y., Waszcak J. Phys. Rev. Lett. 56:1986;2700 Felcher G.P., Hilleke R.O., Crawford R.K., Haumann J., Kleb R., Ostrowski G. Rev. Sci. Instr. 58:1987;609.
3. Blundell S.J., Bland J.A.C. Phys. Rev. B. 46:1992;3391 Pleshanov N.K. Z. Phys. B. 94:1994;233.
4. Blundell S.J., Bland J.A.C. Phys. Rev. B. 46:1992;3391 Pleshanov N.K. Z. Phys. B. 94:1994;233.
5. Fermon C.et al. Physica B. 267-268:1999;162.
6. Durr H.et al. Science. 284:1999;2166 Dudzik E., Dhesi S.S., Durr H., Collins S.P., Roper M.D., van-der-Laan G., Chesnel K., Belakhovsky M., Marty, A., Samson Y. Phys. Rev. B. 62:2000;5779.
7. Durr H.et al. Science. 284:1999;2166 Dudzik E., Dhesi S.S., Durr H., Collins S.P., Roper M.D., van-der-Laan G., Chesnel K., Belakhovsky M., Marty, A., Samson Y. Phys. Rev. B. 62:2000;5779.
8. Müller-Buschbaum P., Gutmann J.S., Stamm M., Cubitt R., Cunis S., von Krosigk G., Gehrke R., Petry W. Physica B. 283:2000;53.
9. Samson Y., Marty A., Hoffmann R., Gehanno V., Gilles B. J. Appl. Phys. 85:1999;4604.
10. Marty A., Samson Y., Gilles B., Belakhovsky M., Dudzik E., Durr E., Dhesi S., van-der-Laan G., Goedkoop J.B. J. Appl. Phys. 87:2000;5472.
11. Sinha S.K., Sirota E.B., Garo S., Stanley H.B. Phys. Rev. B. 38:1988;2297.
12. R. Lazzari, J. Appl. Crystal 35 (2002) 406; http://www.esrf.fr/computing/scientific/joint_projects/IsGISAXS/isgisaxs.htm.
13. T. Keller, M.T. Rekveldt, K. Habicht, Appl. Phys. A-Mater. 74 (2002) S127, Suppl. Part I.
14. Viret M., Samson Y., Warin P., Marty A., Ott F., Sondergard E., Klein O., Fermon C. Phys. Rev. Lett. 85:2000;3962.
15. OOMMF is a freeware micromagnetic simulation package developed by NIST. It is available at http://math.nist.gov/oommf/software.html.
16. For color figures, you may refer to " www-llb.cea.fr/prism/publications.html ".